A Wide-Operating Range Standard-Cell Based Memory in 28nm FD-SOI
نویسندگان
چکیده
This study presents an energy-efficient ultra-low voltage standard-cell based memory in 28 nm FD-SOI. The storage element (standard-cell latch) is replaced with a fullcustom designed latch with 50% less area. Error-free operation is demonstrated down to 450mV @ 9MHz. By utilizing body bias (BB) @ VDD = 0.5V performance spans from 20MHz @ BB=0V to 110MHz @ BB=1V.
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